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3 <section niv='
1'
><title>Overview
</title>
5 <section niv='
2'
><title>Static Timing Analysis
</title>
6 <p>The advent of semiconductor fabrication technologies now allows high performance in complex
7 integrated circuits.
</p>
8 <p>With the increasing complexity of these circuits, static timing analysis (STA)
9 has revealed itself as the only feasible method ensuring that expected performances are
10 actually obtained.
</p>
11 <p>In addition, signal integrity (SI) issues due to crosstalk play a crucial role in
12 performance and reliability of these systems, and must be taken into account during
13 the timing analysis.
</p>
14 <p>However, performance achievement not only lies in fabrication technologies, but also
15 in the way circuits are designed. Very high performance designs are obtained with semi or
16 full-custom designs techniques.
</p>
17 <p>The
&tool; platform provides advanced STA and SI solutions at transistor level. It has
18 been built-up in order to allow engineers to ensure complete timing and SI coverage on their digital
19 custom designs, as well as IP-reuse through timing abstraction.
</p>
20 <p>Furthermore, hierarchy handling through transparent timing views allows full-chip
21 verification, with virtually no limit of capacity in design size.
</p>
24 <section niv='
2'
><title>Signal Integrity Analysis
</title>
25 <p>&tool; crosstalk engine is coupled with static timing analysis (STA) engine and is based
26 upon a multi-switching windows refinement algorithm.
</p>
27 <p>Crosstalk effects are then fully handled in timing checks. Precise delay update is done thanks
28 to current source models for gate, and non-linear charge transfer models for effective wire load
30 <p>Detailed SI report provides:
</p>
32 <item>Delta-delays in gates and interconnects
</item>
33 <item>Effective noise contribution of each aggressor
</item>
34 <item>Overshoot and undershoot peaks, together with sensitivity of the fan-out gates
</item>
35 <item>Statistical noise classification allowing Engineering Change Orders
</item>
37 <p>The graphical user interface (GUI) allows easy execution of the crosstalk analysis.
</p>
40 <section niv='
2'
><title>Applications
</title>
41 <p>&tool; can be used on a wide range of ICs, such as Micro-Processors, Micro-Controllers,
42 Memory Controllers, Custom IPs or Standard-Cell Libraries (Arithmetic Units, Data-Paths...). It
43 provides the following benefits:
</p>
44 <p>Timing sign-off
</p>
46 <item>Digital custom macros STA sign-off
</item>
47 <item>Full-chip STA sign-off
</item>
49 <p>Signal Integrity sign-off
</p>
51 <item>Digital custom macros crosstalk analysis
</item>
52 <item>Full-chip crosstalk analysis
</item>
54 <p>Design and debug
</p>
56 <item>Circuit timing analysis during design phase
</item>
57 <item>Early detection of timing bottlenecks
</item>
59 <p>IP Reuse (.lib files generation)
</p>
61 <item>Digital custom macros characterization
</item>
62 <item>Standard cells re-characterization
</item>
66 <section niv='
2'
><title>Key Features
</title>
67 <p>&tool; provides the following features:
</p>
69 <item>Vector-free fast simulation engine, accuracy within
5% of SPICE
</item>
70 <item>Current Source Modeling (CSM) of drivers, AWE modeling of interconnects
</item>
71 <item>SPICE, VHDL or VERILOG netlist support, SPICE, SPEF or DSPF parasitics support, BSIM3 and BSIM4 support
</item>
72 <item>Design-style support: latch-based, domino logic, barrel shifters, multipliers
</item>
73 <item>Advanced timing checks: cycle sharing, cycle stealing, multicycle paths
</item>
74 <item>Full-Chip analysis through transparent hierarchy
</item>
75 <item>Cross corner analysis
</item>
76 <item>STA and SI coupled analysis
</item>
77 <item>Non-linear noise models
</item>
78 <item>Statistical noise classification
</item>
79 <item>GUI and Tcl interface
</item>
80 <item>Critical path automatic spice deck
</item>
81 <item>SDC timing constraints
</item>